Note: Simultaneous determination of local temperature and thickness of heated cantilevers using two-wavelength thermoreflectance

Cited 4 time in webofscience Cited 3 time in scopus
  • Hit : 387
  • Download : 9
In this work, we have demonstrated that two-wavelength thermoreflectance technique can be used to characterize the local thickness and temperature of heated cantilevers at steady-state operation. By taking the ratio of reflectances for two lasers with different wavelengths, the geometrical factor causing the mismatch between experimentally measured and theoretically calculated reflectances was eliminated. Based on the fitting analysis of the reflectance ratio of two wavelengths at various input powers to the heated cantilevers, the local temperature and thickness could be unambiguously determined.
Publisher
AMER INST PHYSICS
Issue Date
2014-03
Language
English
Article Type
Article
Keywords

FORCE MICROSCOPE CANTILEVERS; SILICON; CALIBRATION

Citation

REVIEW OF SCIENTIFIC INSTRUMENTS, v.85, no.3, pp.036109

ISSN
0034-6748
DOI
10.1063/1.4869079
URI
http://hdl.handle.net/10203/189226
Appears in Collection
ME-Journal Papers(저널논문)
Files in This Item
This item is cited by other documents in WoS
⊙ Detail Information in WoSⓡ Click to see webofscience_button
⊙ Cited 4 items in WoS Click to see citing articles in records_button

qr_code

  • mendeley

    citeulike


rss_1.0 rss_2.0 atom_1.0