Investigation of domain structure and polarization switching behavior in ferroelectric materials using angle-resolved piezoresponse force microscopyAngle-resolved piezoresponse force microscopy를 이용한 강유전체물질에서의 도메인구조와 분극반전거동에 대한 연구
- Advisors
- No, Kwang-Sooresearcher; 노광수
- Description
- 한국과학기술원 : 신소재공학과,
- Publisher
- 한국과학기술원
- Issue Date
- 2012
- Identifier
- 487116/325007 / 020085071
- Language
- eng
- Description
학위논문(박사) - 한국과학기술원 : 신소재공학과, 2012.2, [ x, 103 p. ]
- Keywords
Angle-resolved piezoresponse force microscopy; Ferroelectric domain structure; Polarization switching behavior; BiFeO3 thin films; 강유전도메인구조; Angle-resolved piezoresponse force microscopy; 분극반전거동; BiFeO3 박막; Pb(Zr0.25Ti0.75)O3 다결정박막; Polycrystalline Pb(Zr0.25Ti0.75)O3 thin films
- Appears in Collection
- MS-Theses_Ph.D.(박사논문)
- Files in This Item
- There are no files associated with this item.
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