Trap states analysis based on charge-pumping technique & its applications차지펌핑을 이용한 트랩 상태 분석 및 응용

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Advisors
Choi, Yang-Kyuresearcher최양규
Description
한국과학기술원 : 전기 및 전자공학과,
Publisher
한국과학기술원
Issue Date
2012
Identifier
486675/325007  / 020085028
Language
eng
Description

학위논문(박사) - 한국과학기술원 : 전기 및 전자공학과, 2012.2, [ vi, 154 p. ]

Keywords

Trap States; Charge-Pumping; Field-Effect-Transistor; Interface; 차지펌핑; 신뢰성 분석; 계면 트랩; 트랜지스터; 바이오센서; Biosensor

URI
http://hdl.handle.net/10203/180201
Link
http://library.kaist.ac.kr/search/detail/view.do?bibCtrlNo=486675&flag=dissertation
Appears in Collection
EE-Theses_Ph.D.(박사논문)
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