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The Effect of Bias Stress on the Performance of Amorphous InAlZnO-Based Thin Film Transistors Liu, Mingyuan; Qin, Fei; Rothschild, Molly; Zhang, Yuxuan; Lee, Dong Hun; No, Kwangsoo; Song, Han Wook; et al, JOURNAL OF ELECTRONIC MATERIALS, v.51, no.4, pp.1813 - 1819, 2022-04 |
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