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1
(A) Study on the stabilization of low dielectric SiOF thin film deposited by electron cyclotron resonance plasma enhanced chemical vapor deposition = ECRPECVD 법으로 증착한 저유전율 SiOF 박막의 안정화에 관한 연구link

Kim, Suk-Pil; 김석필; et al, 한국과학기술원, 2002

2
Arsenic 이온이 주입된 실리콘에서 결함 생성에 관한 투과전자현미경 연구 = A transmission electron microscopy study on the generation of defects in $As^+$ implanted siliconlink

신유균; Shin, Yu-Gyun; et al, 한국과학기술원, 2002

3
Characterization of CeO2 thin films as insulator of metal ferroelectric insulator semiconductor (MFIS) structures

Song, HW; Lee, CS; Kim, DG; No, Kwangsoo, THIN SOLID FILMS, v.368, no.1, pp.61 - 66, 2000

4
Contraction stress build-up of anisotropic conductive films (ACFs) for flip-chip interconnection: Effect of thermal and mechanical properties of ACFs

Kwon, WS; Paik, Kyung-Wook, JOURNAL OF APPLIED POLYMER SCIENCE, v.93, no.6, pp.2634 - 2641, 2004-09

5
Platinum (100) hillock growth in Pt/Ti electrode stack for SrBi2Ta2O9 ferroelectric random access memory

Jung, WW; Choi, Si-Kyung; Kweon, SY; Yeom, SJ, JOURNAL OF ELECTROCERAMICS, v.13, no.1-3, pp.55 - 63, 2004-07

6
Residual stress effect on self-annealing of electroplated copper

Lee, CH; Park, Chong-Ook, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, v.42, no.7, pp.4484 - 4488, 2003-07

7
Residual stress measurements in electroless plated Ni-P films

Song, JY; Yu, Jin, THIN SOLID FILMS, v.415, no.1-2, pp.167 - 172, 2002-08

8
Strength versus ductility in carbon nanotube reinforced nickel matrix nanocomposites

Borkar, Tushar; Hwang, Jaewon; Hwang, Jun Yeon; Scharf, Thomas W.; Tiley, Jaimie; Hong, Soon Hyung; Banerjee, Rajarshi, JOURNAL OF MATERIALS RESEARCH, v.29, no.6, pp.761 - 769, 2014-03

9
The effect of stress on solid-phase epitaxial regrowth in As+-implanted two-dimensional amorphized Si

Shin, YG; Lee, JeongYong; Park, MH; Kang, HK, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES REVIEW PAPERS, v.40, no.11, pp.6192 - 6197, 2001-11

10
상온에서 증착한 AZO 박막의 후열처리효과가 전기적, 구조적 특성에 미치는 영향 = Post-annealing effects on the electrical and structural properties of AZO thin films deposited at room temperaturelink

이성환; Lee, Sung-hwan; et al, 한국과학기술원, 2008

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