1 | Effect of a rapid thermal annealing process on the electrical properties of an aluminum-doped indium zinc tin oxide thin film transistor Nam, Yunyong; Yang, Jong-Heon; Jeong, Pilseong; Kwon, Oh-Sang; Pi, Jae-Eun; Cho, Sung Haeng; Hwang, Chi-Sun; et al, PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, v.214, no.1, 2017-01 |
2 | Effect of annealing on the microstructural and optical properties of InAs quantum dots grown on GaAs buffer layers Lee, KH; Lee, HS; Lee, JeongYong; Lee, DU; Kim, TW; Kim, MD, JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.45, pp.S799 - S802, 2004-12 |
3 | Effects of annealing conditions on the crystallization and grain growth of metastable Ge2Sb2Te5 Park, YJ; Lee, JeongYong; Youm, MS; Kim, YT, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, v.44, pp.326 - 327, 2005-01 |
4 | Fabrication of a High-Performance Poly-Si Thin-Film Transistor Using a Poly-Si Film Prepared by Silicide-Enhanced Rapid Thermal Annealing Process Yang, Yong Ho; Ahn, Kyung Min; Kang, Seung Mo; Mun, Seonhong; Ahn, Byung-Tae, ELECTRONIC MATERIALS LETTERS, v.10, no.6, pp.1081 - 1085, 2014-11 |
5 | Fabrication of Polycrystalline Si Films by Vapor-Induced Crystallization and Rapid Thermal Annealing Process Yang, Yong-Ho; Ahn, Kyung-Min; Ahn, Byung-Tae, ELECTROCHEMICAL AND SOLID STATE LETTERS, v.13, no.8, pp.92 - 95, 2010 |
6 | Improvement in Thermal Stability of Nickel Silicides Using NiNx Films Kim, Sun Il; Lee, Seung Ryul; Ahn, Kyung Min; Ahn, Byung Tae, JOURNAL OF THE ELECTROCHEMICAL SOCIETY, v.157, no.3, pp.231 - 234, 2010 |
7 | Study of Band Structure at the Zn(S,O,OH)/Cu(In,Ga)Se-2 Interface via Rapid Thermal Annealing and Their Effect on the Photovoltaic Properties Shin, Dong Hyeop; Kim, Seung Tae; Kim, Ji Hye; Kang, Hee Jae; Ahn, Byung Tae; Kwon, Hyuk-Sang, ACS APPLIED MATERIALS & INTERFACES, v.5, no.24, pp.12921 - 12927, 2013-12 |
8 | Transformation mechanisms from metallic Zn nanocrystals to insulating ZnSiO(3) nanocrystals in a SiO(2) matrix due to thermal treatment Yuk, Jong Min; Lee, Jeong-Yong; No, Y. S.; Kim, T. W.; Choi, W. K., APPLIED PHYSICS LETTERS, v.93, no.22, 2008-12 |
9 | 기상유도결정화법과 급속열처리를 이용한 다결정 Si 박막에서의 Ni 금속 오염량 감소 및 다결정 Si 박막 트랜지스터 특성에 관한 연구 = Control of Ni contamination in polycrystalline Si films by vapor-induced crystallization and rapid thermal annealing process and characterization of polycrystalline Si thin film transistorslink 김존수; Kim, John-Soo; et al, 한국과학기술원, 2013 |