Browse "Dept. of Materials Science and Engineering(신소재공학과)" by Subject bias stability

Showing results 1 to 5 of 5

Channel Protection Layer Effect on the Performance of Oxide TFTs

Park, Sang-Hee Koresearcher; Cho, Doo-Hee; Yang, Shinhyuk; Ryu, Min Ki; Hwang, Chi-Sun; Yoon, Sung Min; Cheong, Woo-Seok; et al, ETRI JOURNAL, v.31, no.6, pp.653 - 659, 2009-12

Comparative Study on Light-Induced Bias Stress Instability of IGZO Transistors With SiNx and SiO2 Gate Dielectrics

Ji, Kwang Hwan; Kim, Ji-In; Mo, Yeon-Gon; Jeong, Jong Han; Yang, Shinhyuk; Hwang, Chi-Sun; Park, Sang-Hee Koresearcher; et al, IEEE ELECTRON DEVICE LETTERS, v.31, no.12, pp.1404 - 1406, 2010-12

Device reliability under electrical stress and photo response of oxide TFTs

Park, Sang-Hee Koresearcher; Ryu, Min-Ki; Yoon, Sung-Min; Yang, Shinhyuk; Hwang, Chi-Sun; Jeon, Jae-Hong, JOURNAL OF THE SOCIETY FOR INFORMATION DISPLAY, v.18, no.10, pp.779 - 788, 2010-10

Improved Electrical Performance and Bias Stability of Solution-Processed Active Bilayer Structure of Indium Zinc Oxide based TFT

Seo, Jinsuk; Bae, Byeong-Sooresearcher, ACS APPLIED MATERIALS & INTERFACES, v.6, no.17, pp.15335 - 15343, 2014-09

Light Effects on the Bias Stability of Transparent ZnO Thin Film Transistors

Shin, Jae-Heon; Lee, Ji-Su; Hwang, Chi-Sun; Park, Sang-Hee Koresearcher; Cheong, Woo-Seok; Ryu, Minki; Byun, Chun-Won; et al, ETRI JOURNAL, v.31, no.1, pp.62 - 64, 2009-02



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