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Observation of V-shaped defects in the growth of In0.8Al0.2Sb/InSb layers: Temperature and V/III flux ratio dependences Kim, Y. H.; Lee, JeongYong; Noh, Y. G.; Kim, M. D.; Kwon, Y. J.; Oh, J. E., JOURNAL OF CRYSTAL GROWTH, v.296, no.1, pp.75 - 80, 2006-10 |
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