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Reliable Control of Filament Formation in Resistive Memories by Self-Assembled Nanoinsulators Derived from a Block Copolymer You, Byoungkuk; Park, Woon Ik; Kim, JongMin; Park, Kwi Il; Seo, Hyeon Kook; Lee, JeongYong; Jung, Yeon Sik; et al, ACS NANO, v.8, no.9, pp.9492 - 9502, 2014-09 |
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