Showing results 1 to 2 of 2
A study of the oxidation behavior and the postannealing effect in a graded SiGe/Si heterostructure Lim, YS; Jeong, JS; Lee, JeongYong; Kim, HS; Shon, HK; Kim, HK; Moon, DW, JOURNAL OF ELECTRONIC MATERIALS, v.31, no.5, pp.529 - 534, 2002-05 |
Observation of stress relaxation via step formation in Co/Pt metallic superlattices Shin, Sung-Chul; Kim, YS; Kim, HS; Lee, JeongYong, APPLIED PHYSICS LETTERS, v.76, no.7, pp.831 - 833, 2000-02 |
Discover