Browse "Dept. of Materials Science and Engineering(신소재공학과)" by Subject Buffer Layer

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1
Degradation Characteristics of MgO Based Magnetic Tunnel Junction Caused by Surface Roughness of Ta/Ru Buffer Layers

Lee, Jung Min; Choi, Chul Min; Sukegawa, Hiroaki; Lee, Jeong Yongresearcher; Mitani, Seiji; Song, Yun-Heub, JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, v.16, no.1, pp.654 - 657, 2016-01

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