Browse "Dept. of Materials Science and Engineering(신소재공학과)" by Subject BIAS

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Electrical Measurement of Antiferromagnetic Moments in Exchange-Coupled IrMn/NiFe Stacks

Marti, X; Park, Byong Gukresearcher; Wunderlich, J; Reichlova, H; Kurosaki, Y; Yamada, M; Yamamoto, H; et al, PHYSICAL REVIEW LETTERS, v.108, no.1, 2012-01

Influence of gate dielectric/channel interface engineering on the stability of amorphous indium gallium zinc oxide thin-film transistors

Cho, Sung Haeng; Ryu, Min Ki; Kim, Hee-Ok; Kwon, Oh-Sang; Park, Eun-Sook; Roh, Yong-Suk; Hwang, Chi-Sun; et al, PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, v.211, no.9, pp.2126 - 2133, 2014-09



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