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Atomic diffusion induced degradation in bimetallic layer coated cemented tungsten carbide Peng, Zirong; Rohwerder, Michael; Choi, Pyuck-Pa; Gault, Baptiste; Meiners, Thorsten; Friedrichs, Marcel; Kreilkamp, Holger; et al, CORROSION SCIENCE, v.120, pp.1 - 13, 2017-05 |
Nanoscale bit formation in highly (111)-oriented ferroelectric thin films deposited on glass substrates for high-density storage media Kim, Dae Hong; Kim, Yong Kwan; Hong, Daniel Seungbum; Kim, Yunseok; Baik, Sunggi, NANOTECHNOLOGY, v.22, no.24, 2011-05 |
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