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Scalable Fabrication of High-Performance Thin-Shell Oxide Nanoarchitected Materials via Proximity-Field Nanopatterning Bae, Gwangmin; Jang, Dongchan; Jeon, Seokwoo, ACS NANO, v.15, no.3, pp.3960 - 3970, 2021-03 |
Size dependence of lattice deformation induced by growth stress in Sn nanowires Shin, Ho-Sun; Yu, Jin; Song, Jae-Yong; Park, Hyun-Min, APPLIED PHYSICS LETTERS, v.94, no.1, 2009-01 |
고집적 DRO FRAM 소자용 PZT 박막 캐패시터의 신뢰성 연구 = Reliability study in PZT thin film capacitors for high-density DRO FRAM deviceslink 이강운; Lee, Kang-Woon; et al, 한국과학기술원, 2003 |
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