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Browse "Dept. of Materials Science and Engineering(신소재공학과)" by Subject PZT thin film

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Showing results 1 to 9 of 9

1
Determination of the linear electrooptic coefficient of a lead zirconate titanate thin film using two-beam polarization interferometer with an adaptive photodetector

Spirin, VV; Lee, C; No, Kwangsoo; Sokolov, IA, JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, v.37, no.5A, pp.519 - 521, 1998-05

2
Measurement of the differential Pockels and Kerr coefficients of thin films by a two-beam polarization interferometer with a reflection configuration

Spirin, VV; Mendieta, FJ; No, Kwangsoo, FERROELECTRICS, v.271, pp.1911 - 1916, 2002

3
Measurement of the quadratic electrooptic coefficient of lead zirconate titanate thin film by a two-beam polarization interferometer

Spirin, VV; Lee, CH; No, Kwangsoo, OPTICS COMMUNICATIONS, v.158, no.1-6, pp.239 - 249, 1998-12

4
PZT/MgO/Si 박막의 제조와 특성평가 = A study on the fabrication and characterization of PZT/MgO/Si filmlink

송한욱; Song, Han-Wook; et al, 한국과학기술원, 1998

5
PZT박막의 건조온도에 따른 전광계수의 측정 및 분석 = Measurement and analysis of the electro-optic coefficient with drying temperature in PZT thin filmslink

이창호; Lee, Chang-Ho; et al, 한국과학기술원, 1998

6
Reactive sputtering법에 의한 $Pb(Zr,Ti)O_3$ 박막의 제조 및 특성평가에 관한 연구 = A study on the preparations and characterizations of $Pb(Zr,Ti)O_3$ thin films by reactive sputteringlink

조능호; Cho, Neung-Ho; et al, 한국과학기술원, 1995

7
Sb 첨가를 통한 PZT박막의 electrical degradation mechanism에 관한 연구 = A study on the electrical degradation mechanism in PZT thin films by Sb additionlink

최원열; Choi, Won-Youl; et al, 한국과학기술원, 1998

8
레이저 박리 기술을 이용한 플렉서블 전자소자 제작 및 특성 평가 = Fabrication and characterization of flexible electronic devices by usnig laser lift-off techniquelink

손정환; Son, Jung-Hwan; 이건재; Lee, Keon-Jae; et al, 한국과학기술원, 2014

9
압전 박막을 이용한 Bragg 회절형 acousto-optic 소자의 제조 및 특성평가 = Fabrication and characterization of bragg-diffraction type acousto-optic device using piezoelectric thin filmslink

이창호; Lee, Chang-Ho; et al, 한국과학기술원, 2002

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