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Showing results 1 to 3 of 3

1
Device reliability under electrical stress and photo response of oxide TFTs

Park, Sang-Hee Ko; Ryu, Min-Ki; Yoon, Sung-Min; Yang, Shinhyuk; Hwang, Chi-Sun; Jeon, Jae-Hong, JOURNAL OF THE SOCIETY FOR INFORMATION DISPLAY, v.18, no.10, pp.779 - 788, 2010-10

2
Improved Stability of Atomic Layer Deposited ZnO Thin Film Transistor by Intercycle Oxidation

Oh, Himchan; Park, Sang-Hee Ko; Ryu, Min Ki; Hwang, Chi-Sun; Yang, Shinhyuk; Kwon, Oh Sang, ETRI JOURNAL, v.34, no.2, pp.280 - 283, 2012-04

3
Trap States of the Oxide Thin Film Transistor

Yu, Kyeong Min; Yuh, Jin Tae; Park, Sang Hee Ko; Ryu, Min Ki; Yun, Eui Jung; Bae, Byung Seong, JAPANESE JOURNAL OF APPLIED PHYSICS, v.52, no.10, 2013-10

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