Browse "Dept. of Materials Science and Engineering(신소재공학과)" by Subject TA2O5

Showing results 1 to 8 of 8

1
Atomic layer deposition of Al2O3 thin films using trimethylaluminum and isopropyl alcohol

Jeon, WS; Yang, S; Lee, CS; Kang, Sang-Won, JOURNAL OF THE ELECTROCHEMICAL SOCIETY, v.149, no.6, pp.306 - 310, 2002-06

2
Defect-Engineered Electroforming-Free Analog HfOx Memristor and Its Application to the Neural Network

Kim, Gil Seop; Song, Hanchan; Lee, Yoon Kyeung; Kim, Ji Hun; Kim, Woohyun; Park, Tae Hyung; Kim, Hae Jin; et al, ACS APPLIED MATERIALS & INTERFACES, v.11, no.50, pp.47063 - 47072, 2019-12

3
EFFECTS OF ANNEALING CONDITIONS ON THE PROPERTIES OF TANTALUM OXIDE-FILMS ON SILICON SUBSTRATES

PARK, SW; BAEK, YK; Park, Chong-Ook; PARK, CO; Lim, Ho Bin, JOURNAL OF ELECTRONIC MATERIALS, v.21, no.6, pp.635 - 639, 1992-06

4
High-tunability and low-microwave-loss Ba0.6Sr0.4TiO3 thin films grown on high-resistivity Si substrates using TiO2 buffer layers

Kim, HS; Kim, Ho Gi; Kim, Il-Doo; Kim, KB; Lee, JC, APPLIED PHYSICS LETTERS, v.87, pp.39468 - 39473, 2005-11

5
Improvement of morphological stability of PEALD-iridium thin films by adopting two-step annealing process

Kim, Sung-Wook; Kwon, Se-Hun; Jeong, Seong-Jun; Park, Jin-Seong; Kang, Sang-Won, ELECTROCHEMICAL AND SOLID STATE LETTERS, v.11, no.11, pp.H303 - H305, 2008-09

6
Low frequency and microwave performances of Ba0.6Sr0.4TiO3 films on atomic layer deposited TiO2/high resistivity Si substrates

Kim, HS; Kim, Il-Doo; Kim, KB; Yun, TS; Lee, JC; Tuller, HL; Choi, WY; et al, JOURNAL OF ELECTROCERAMICS, v.17, pp.421 - 425, 2006-12

7
Low-voltage organic transistors and depletion-load inverters with high-K pyrochlore BZN gate dielectric on polymer substrate

Choi, Y; Kim, Il-Doo; Tuller, HL; Akinwande, AI, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.52, pp.2819 - 2824, 2005-12

8
Structural and dielectric properties of epitaxial Ba0.6Sr0.4TiO3 thin films grown on Si substrates with thin SrO buffer layers

Kim, HS; Hyun, TS; Kim, Ho Gi; Yun, TS; Lee, JC; Kim, Il-Doo, JOURNAL OF ELECTROCERAMICS, v.18, pp.305 - 309, 2007-08

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