A 3-D X-ray microtomographic system with a CMOS image sensor

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High-resolution and three-dimensional X-ray imaging is becoming more and more popular. An X-ray microtomographic system with a CMOS image sensor has been developed. We have developed a novel area X-ray detector with a cost-effective CMOS image sensor. The sensing area of the detector is 55 x 55 mm(2) and the light from the phosphor screen is collected to the CMOS image sensor by a carefully designed optical system. Six lenses are assembled to reduce the radiation damage effect and increase the resolution and sensitivity. A microfocus X-ray tube that can reach up to 5 mum of focal spot size and microprecision motor system that can move in x-y-z directions for both alignment and magnification and rotate the object have been adopted. A conventional three-dimensional cone-beam Feldkamp reconstruction algorithm was used and a human cancellous; bone has been imaged with this system. Currently, the resolution of this system is about 40 mum but the application in microtomography seems very promising using this CMOS X-ray detector.
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Issue Date
2001-08
Language
English
Article Type
Article
Citation

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, v.48, no.4, pp.1505 - 2

ISSN
0018-9499
URI
http://hdl.handle.net/10203/1748
Appears in Collection
NE-Journal Papers(저널논문)
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