A Parameter Extraction Method using Cutoff Measurement for a Large-Scale HSPICE Model of HBT's

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We present an accurate parameter extraction method for the HBT large-signal equivalent circuit model in which several extrinsic parasitics are connected to HSPICE BJT model. The measured Gummel plot are used to extract dc model parameters of HBT using HSPICE. Capacitances are then obtained from S-parameter measurements of the HBT’s biased to cutoff. The other parameters are determined from the active device S-parameters. The large-signal modeled Gummel plot and 5’-parameters show good agreement with the measured ones, respectively.
Description
신소재공학과
Publisher
IEEE-Inst Electrical Electronics Engineers Inc
Issue Date
1994-01
Language
ENG
Article Type
Note
Citation

IEEE TRANSACTIONS ON ELECTRON DEVICES, v.41, no.1, pp.112-114

ISSN
0018-9383
URI
http://hdl.handle.net/10203/1664
Appears in Collection
MS-Journal Papers(저널논문)
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