A large-signal FET model including thermal and trap effects with pulsed I-V measurements

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Publisher
IEEE
Issue Date
2003-06-08
Language
ENG
Citation

2003 IEEE MTT-S International Microwave Symposium Digest, v.1, pp.467 - 470

ISSN
0149-645X
URI
http://hdl.handle.net/10203/1564
Appears in Collection
EE-Conference Papers(학술회의논문)
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