A large-signal FET model including thermal and trap effects with pulsed I-V measurements
- Publisher
- IEEE
- Issue Date
- 2003-06-08
- Language
- English
- Citation
2003 IEEE MTT-S International Microwave Symposium Digest, pp.467 - 470
- ISSN
- 0149-645X
- Appears in Collection
- EE-Conference Papers(학술회의논문)
- Files in This Item
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