Local surface potential distribution in oriented ferroelectric thin films

Using Kelvin force microscopy, the authors have investigated the potential distribution on ferroelectric films. The local distribution of potential was observed on downward, prepoled areas. The polarity of the potential corresponds to the screen charge. It was found that the electrical properties of the grain boundary affect the potential distribution. Most of the grain boundaries show a lower potential than the area inside the grain. The authors identified certain regions at the grain boundary with a very low potential. Such potential pits may act as efficient screen charge draining paths and may lead to important perturbations on the device level. (c) 2007 American Institute of Physics.
Publisher
AMER INST PHYSICS
Issue Date
2007-07
Language
English
Keywords

FORCE MICROSCOPY; PROBE MICROSCOPY; CAPACITORS; BEHAVIOR

Citation

APPLIED PHYSICS LETTERS, v.91, pp.1051 - 1056

ISSN
0003-6951
DOI
10.1063/1.2761502
URI
http://hdl.handle.net/10203/1485
Appears in Collection
MS-Journal Papers(저널논문)
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