Evaluation of thermal fatigue life and failure mechanisms of Sn-Ag-Cu solder joints with reduced Ag contents

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dc.contributor.authorKang S.K.-
dc.contributor.authorLauro P.-
dc.contributor.authorShih D.-Y.-
dc.contributor.authorHenderson D.W.-
dc.contributor.authorGosselin T.-
dc.contributor.authorBartelo J.-
dc.contributor.authorCain S.R.-
dc.contributor.authorGoldsmith C.-
dc.contributor.authorPuttlitz K.J.-
dc.contributor.authorHwang T.-K.-
dc.date.accessioned2013-03-18T00:01:37Z-
dc.date.available2013-03-18T00:01:37Z-
dc.date.created2012-02-06-
dc.date.issued2004-06-01-
dc.identifier.citation2004 Proceedings - 54th Electronic Components and Technology Conference, v.1, no., pp.661 - 667-
dc.identifier.issn0569-5503-
dc.identifier.urihttp://hdl.handle.net/10203/143013-
dc.languageENG-
dc.titleEvaluation of thermal fatigue life and failure mechanisms of Sn-Ag-Cu solder joints with reduced Ag contents-
dc.typeConference-
dc.identifier.scopusid2-s2.0-10444286031-
dc.type.rimsCONF-
dc.citation.volume1-
dc.citation.beginningpage661-
dc.citation.endingpage667-
dc.citation.publicationname2004 Proceedings - 54th Electronic Components and Technology Conference-
dc.identifier.conferencecountryUnited States-
dc.identifier.conferencecountryUnited States-
dc.contributor.localauthorHwang T.-K.-
dc.contributor.nonIdAuthorKang S.K.-
dc.contributor.nonIdAuthorLauro P.-
dc.contributor.nonIdAuthorShih D.-Y.-
dc.contributor.nonIdAuthorHenderson D.W.-
dc.contributor.nonIdAuthorGosselin T.-
dc.contributor.nonIdAuthorBartelo J.-
dc.contributor.nonIdAuthorCain S.R.-
dc.contributor.nonIdAuthorGoldsmith C.-
dc.contributor.nonIdAuthorPuttlitz K.J.-
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