Inspection system for microelectronics BGA package using wavelength scanning interferometry

Publisher
International Society for Optical Engineering (SPIE)
Issue Date
2001-10-29
Language
ENG
Description

Copyright (2001) Society of Photo-Optical Instrumentation Engineers.

Citation

Optomechatronic Systems II, v.4564, pp.74 - 85

URI
http://hdl.handle.net/10203/1382
Appears in Collection
ME-Conference Papers(학술회의논문)
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