Imaging, structural and chemical analysis of silicon nanowires
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Barsotti Jr. R.J. | - |
| dc.contributor.author | Fischer J.E. | - |
| dc.contributor.author | Lee C.H. | - |
| dc.contributor.author | Mahmood J. | - |
| dc.contributor.author | Adu C.K.W. | - |
| dc.contributor.author | Eklund P.C. | - |
| dc.date.accessioned | 2013-03-16T02:50:14Z | - |
| dc.date.available | 2013-03-16T02:50:14Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 2002-12-02 | - |
| dc.identifier.citation | Quantum Confined Semiconductor Nanostructures, v.737, no., pp.627 - 631 | - |
| dc.identifier.issn | 0272-9172 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/126668 | - |
| dc.language | ENG | - |
| dc.title | Imaging, structural and chemical analysis of silicon nanowires | - |
| dc.type | Conference | - |
| dc.identifier.scopusid | 2-s2.0-0037811553 | - |
| dc.type.rims | CONF | - |
| dc.citation.volume | 737 | - |
| dc.citation.beginningpage | 627 | - |
| dc.citation.endingpage | 631 | - |
| dc.citation.publicationname | Quantum Confined Semiconductor Nanostructures | - |
| dc.identifier.conferencecountry | United States | - |
| dc.identifier.conferencecountry | United States | - |
| dc.contributor.localauthor | Lee C.H. | - |
| dc.contributor.nonIdAuthor | Barsotti Jr. R.J. | - |
| dc.contributor.nonIdAuthor | Fischer J.E. | - |
| dc.contributor.nonIdAuthor | Mahmood J. | - |
| dc.contributor.nonIdAuthor | Adu C.K.W. | - |
| dc.contributor.nonIdAuthor | Eklund P.C. | - |
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