렌즈품질검사를 위한 신경회로망의 응용'Use of Neural Network Model for Quality Control of Lens
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 김민수 | - |
| dc.contributor.author | 오준호 | - |
| dc.date.accessioned | 2013-03-16T00:07:12Z | - |
| dc.date.available | 2013-03-16T00:07:12Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 2000 | - |
| dc.identifier.citation | 한국정밀공학회 2000년 춘계학술대회, v., no., pp.351 - 354 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/125385 | - |
| dc.description.abstract | Aberration is consist of lens's own aberration and aberration induced by wrong arrangement between lens and the light source. Before the performance test of lenses using optical interferometer, lens and the light source must be arranged so that aberration for wrong arrangement to be eliminated. Lens arrangement has been performed by a trained labor. In this paper we propose the scheme for the automatic lens arrangement in lens's performance testing. | - |
| dc.language | KOR | - |
| dc.publisher | 한국정밀공학회 | - |
| dc.title | 렌즈품질검사를 위한 신경회로망의 응용' | - |
| dc.title.alternative | Use of Neural Network Model for Quality Control of Lens | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.beginningpage | 351 | - |
| dc.citation.endingpage | 354 | - |
| dc.citation.publicationname | 한국정밀공학회 2000년 춘계학술대회 | - |
| dc.identifier.conferencecountry | South Korea | - |
| dc.identifier.conferencecountry | South Korea | - |
| dc.contributor.localauthor | 오준호 | - |
| dc.contributor.nonIdAuthor | 김민수 | - |
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