The experimental and theoretical approaches of contraction stress build-up of anisotropic conductive adhesives for flip chip interconnection

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dc.contributor.authorKwon, WSko
dc.contributor.authorYang, SYko
dc.contributor.authorLee, Soon-Bokko
dc.contributor.authorPaik, Kyung-Wookko
dc.date.accessioned2007-09-03T06:41:56Z-
dc.date.available2007-09-03T06:41:56Z-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.issued2005-05-31-
dc.identifier.citation55th Electronic Components and Technology Conference, ECTC, pp.1468 - 1474-
dc.identifier.issn0569-5503-
dc.identifier.urihttp://hdl.handle.net/10203/1238-
dc.description.sponsorshipThis work was supported by the Center for Electronic Packaging Materials of the Korea Science and Engineering Foundation.en
dc.languageEnglish-
dc.language.isoen_USen
dc.publisherIEEE-
dc.titleThe experimental and theoretical approaches of contraction stress build-up of anisotropic conductive adhesives for flip chip interconnection-
dc.typeConference-
dc.identifier.wosid000230581600228-
dc.identifier.scopusid2-s2.0-24644516786-
dc.type.rimsCONF-
dc.citation.beginningpage1468-
dc.citation.endingpage1474-
dc.citation.publicationname55th Electronic Components and Technology Conference, ECTC-
dc.identifier.conferencecountryUS-
dc.identifier.conferencelocationLake Buena Vista, FL-
dc.embargo.liftdate9999-12-31-
dc.embargo.terms9999-12-31-
dc.contributor.localauthorLee, Soon-Bok-
dc.contributor.localauthorPaik, Kyung-Wook-
dc.contributor.nonIdAuthorKwon, WS-
dc.contributor.nonIdAuthorYang, SY-
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