CrCu based UBM (under bump metallization) study with electroplated Pb/63Sn solder bumps - Interfacial reaction and bump shear strength

Electroplating solder bumping process offers fine pitch, highly reliable, and cost effective advantages for flip-chip technology. In this technology, under bump metallization (UBM) is required for chemical solder deposition and mechanically reliable solder,contact to Al pads. The evaporated Cr/phased CrCu/Cu structure UBM has been used with 95Pb/5Sn and also with 37Pb/63Sn solder for flip-chip interconnection. In this study, the intermediate CrCu layer is modified using various sputtering techniques, and the underlying Cr adhesion layer is compared with TiW. Six UBM systems were selected, and their interfacial reaction and bump shear strength were investigated using 100 mum and 50 mum size electroplated Pb/63Sn solder bumps. The results demonstrate that the final Cu layer should have a minimum thickness, more than 0.8 mum, for interface stability on CrCu based UBMs. Intermetallic compound growth and CrCu layer interface changes are more severe after 20 min reflow at 210degreesC compared with 1000 h aging at 125degreesC. Especially for small size bumps, the more stable interface between UBM and solder bump is required.
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Issue Date
2003-03
Language
ENG
Keywords

CU-SN; INTERMETALLIC GROWTH; EUTECTIC SNPB; SPHEROIDS

Citation

IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES, v.26, no.1, pp.245 - 254

ISSN
1521-3331
URI
http://hdl.handle.net/10203/1235
Appears in Collection
MS-Journal Papers(저널논문)
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