Yield Management in Semiconductor Manufacturing Using Hybrid System of Case Based reasoning and Neural Networks
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Park, Sang Chan | - |
| dc.date.accessioned | 2013-03-15T15:24:20Z | - |
| dc.date.available | 2013-03-15T15:24:20Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 1998 | - |
| dc.identifier.citation | Int'l Symp. on Manufacturing Strategy, v., no., pp.136 - 141 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/120733 | - |
| dc.language | ENG | - |
| dc.title | Yield Management in Semiconductor Manufacturing Using Hybrid System of Case Based reasoning and Neural Networks | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.beginningpage | 136 | - |
| dc.citation.endingpage | 141 | - |
| dc.citation.publicationname | Int'l Symp. on Manufacturing Strategy | - |
| dc.identifier.conferencecountry | Japan | - |
| dc.identifier.conferencecountry | Japan | - |
| dc.contributor.localauthor | Park, Sang Chan | - |
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