Improved stability of polysilicon thin-film transistors under self-heating and high endurance EEPROM cells for systems-on-panel
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Lee Jin-Woo | ko |
| dc.contributor.author | Lee Nae-In | ko |
| dc.contributor.author | Chung Hoon-Ju | ko |
| dc.contributor.author | Han Chul-Hi | ko |
| dc.date.accessioned | 2013-03-15T10:37:11Z | - |
| dc.date.available | 2013-03-15T10:37:11Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 1998-12-06 | - |
| dc.identifier.citation | Proceedings of the 1998 IEEE International Electron Devices Meeting, pp.265 - 268 | - |
| dc.identifier.issn | 0163-1918 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/118716 | - |
| dc.language | English | - |
| dc.publisher | IEEE | - |
| dc.title | Improved stability of polysilicon thin-film transistors under self-heating and high endurance EEPROM cells for systems-on-panel | - |
| dc.type | Conference | - |
| dc.identifier.wosid | 000078581800061 | - |
| dc.identifier.scopusid | 2-s2.0-0032271794 | - |
| dc.type.rims | CONF | - |
| dc.citation.beginningpage | 265 | - |
| dc.citation.endingpage | 268 | - |
| dc.citation.publicationname | Proceedings of the 1998 IEEE International Electron Devices Meeting | - |
| dc.identifier.conferencecountry | US | - |
| dc.identifier.conferencelocation | San Francisco, CA, USA | - |
| dc.contributor.localauthor | Han Chul-Hi | - |
| dc.contributor.nonIdAuthor | Lee Jin-Woo | - |
| dc.contributor.nonIdAuthor | Lee Nae-In | - |
| dc.contributor.nonIdAuthor | Chung Hoon-Ju | - |
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