Improved stability of polysilicon thin-film transistors under self-heating and high endurance EEPROM cells for systems-on-panel
- Publisher
- IEEE
- Issue Date
- 1998-12-06
- Language
- English
- Citation
Proceedings of the 1998 IEEE International Electron Devices Meeting, pp.265 - 268
- ISSN
- 0163-1918
- Appears in Collection
- RIMS Conference Papers
- Files in This Item
- There are no files associated with this item.
This item is cited by other documents in WoS
| ⊙ Detail Information in WoSⓡ | Click to see |  |
| ⊙ Cited 10 items in WoS | Click to see citing articles in |  |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.