Improvement in HgCdTe diode characteristics by flip-chip bonded annealing

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dc.contributor.authorBae, S.-H.ko
dc.contributor.authorKim, Y.-H.ko
dc.contributor.authorKim, K.ko
dc.contributor.authorLee, Hee Chulko
dc.contributor.authorKim, Choong Kiko
dc.contributor.authorShin, HCko
dc.date.accessioned2013-03-15T10:11:02Z-
dc.date.available2013-03-15T10:11:02Z-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.issued1997-04-20-
dc.identifier.citationInfrared Technology and Applications XXIII, pp.104 - 110-
dc.identifier.urihttp://hdl.handle.net/10203/118529-
dc.languageEnglish-
dc.publisherSPIE-
dc.titleImprovement in HgCdTe diode characteristics by flip-chip bonded annealing-
dc.typeConference-
dc.identifier.wosidA1997BJ64N00012-
dc.identifier.scopusid2-s2.0-58149216397-
dc.type.rimsCONF-
dc.citation.beginningpage104-
dc.citation.endingpage110-
dc.citation.publicationnameInfrared Technology and Applications XXIII-
dc.identifier.conferencecountryUS-
dc.identifier.conferencelocationOrlando, FL-
dc.contributor.localauthorLee, Hee Chul-
dc.contributor.localauthorShin, HC-
dc.contributor.nonIdAuthorBae, S.-H.-
dc.contributor.nonIdAuthorKim, Y.-H.-
dc.contributor.nonIdAuthorKim, K.-
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EE-Conference Papers(학술회의논문)RIMS Conference Papers
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