Gaussian Beam Scanning form a Dielectric-loaded Slit, TM Case
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 명로훈 | - |
| dc.contributor.author | 유종원 | - |
| dc.date.accessioned | 2013-03-15T08:36:25Z | - |
| dc.date.available | 2013-03-15T08:36:25Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 1997 | - |
| dc.identifier.citation | 1997 춘계 마이크로파 및 전파 학술대회, v., no., pp.312 - 317 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/117914 | - |
| dc.language | KOR | - |
| dc.title | Gaussian Beam Scanning form a Dielectric-loaded Slit, TM Case | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.beginningpage | 312 | - |
| dc.citation.endingpage | 317 | - |
| dc.citation.publicationname | 1997 춘계 마이크로파 및 전파 학술대회 | - |
| dc.identifier.conferencecountry | South Korea | - |
| dc.contributor.localauthor | 명로훈 | - |
| dc.contributor.nonIdAuthor | 유종원 | - |
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