On the functional failure and switching time analysis of the MOBILE circuit
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Li, S. R. | - |
| dc.contributor.author | Mazumder, P. | - |
| dc.contributor.author | Yang, Kyounghoon | - |
| dc.date.accessioned | 2007-08-30T07:11:52Z | - |
| dc.date.available | 2007-08-30T07:11:52Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 2005-05-23 | - |
| dc.identifier.citation | IEEE International Symposium on Circuits and Systems 2005, ISCAS 2005, v., no., pp.2531 - 2534 | - |
| dc.identifier.issn | 0271-4310 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/1178 | - |
| dc.description.sponsorship | the Tera Nanoelectronics Design (TND) program | en |
| dc.language | ENG | - |
| dc.language.iso | en_US | en |
| dc.publisher | IEEE | - |
| dc.title | On the functional failure and switching time analysis of the MOBILE circuit | - |
| dc.type | Conference | - |
| dc.identifier.scopusid | 2-s2.0-67649130554 | - |
| dc.type.rims | CONF | - |
| dc.citation.beginningpage | 2531 | - |
| dc.citation.endingpage | 2534 | - |
| dc.citation.publicationname | IEEE International Symposium on Circuits and Systems 2005, ISCAS 2005 | - |
| dc.identifier.conferencecountry | Japan | - |
| dc.identifier.conferencecountry | Japan | - |
| dc.contributor.localauthor | Yang, Kyounghoon | - |
| dc.contributor.nonIdAuthor | Li, S. R. | - |
| dc.contributor.nonIdAuthor | Mazumder, P. | - |
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