MOS Capacitor의 C-t 측정에 의한 Minority Carrier의 Generation Lifetime의 결정
- Issue Date
- 1983
- Language
- KOR
- Citation
대한전자공학회 1 9 8 3년 하계종합학술대회 논문집
- Appears in Collection
- RIMS Conference Papers
- Files in This Item
- There are no files associated with this item.
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