DSpace at KOASAS: Characterization of Two-Dimensional Impurity Profile in Semiconductor Using Direct Solution Method

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College of Engineering(공과대학)School of Electrical Engineering(전기및전자공학부)EE-Conference Papers(학술회의논문)

Characterization of Two-Dimensional Impurity Profile in Semiconductor Using Direct Solution Method

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Kyung, Chong-Min researcher / Yang, Y.Y. / Oh, H.C.

Issue Date: 1984-09

Language: ENG

Citation: 1984 International Electronic Devices and Materials Symposium, pp.213 - 218

URI: http://hdl.handle.net/10203/111900

Appears in Collection: EE-Conference Papers(학술회의논문)

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