Development of a Measurement Method for the Thermal Conductivity of a Thick Film Prepared by a Screen-Printing Technique

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We propose a method that allows us to evaluate the thermal conductivity of a conductive material that has thickness on the order of microns. The key feature of the proposed method is use of a complete thermoelectric device with electrodes and a substrate, while conventional methods measure the temperature gradient of thermoelectric materials directly without electrodes. The measured thermal conductivity of a ZnSb film annealed at 380A degrees C in N-2 ambient for 16 min to 26 min is 1.2 W/m K to 1.4 W/m K. The measurement shows that thermoelectric film prepared by a screen-printing technique has lower thermal conductivity than bulk material (2.2 W/m K to 2.4 W/m K) because the screen-printing technique generates high porosity in the film. The lower measured thermal conductivity of the porous films compared with bulk material supports the reliability of the proposed measurement method.
Publisher
SPRINGER
Issue Date
2012-06
Language
English
Article Type
Article
Keywords

THERMOELECTRIC PROPERTIES; RHEOLOGY

Citation

JOURNAL OF ELECTRONIC MATERIALS, v.41, no.6, pp.1170 - 1176

ISSN
0361-5235
DOI
10.1007/s11664-011-1857-9
URI
http://hdl.handle.net/10203/102875
Appears in Collection
EE-Journal Papers(저널논문)
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