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College of Engineering(공과대학)Dept. of Nuclear and Quantum Engineering(원자력및양자공학과)NE-Journal Papers(저널논문)

Industrial X-ray imaging based on scintillators and CMOS APS array: direct X-ray irradiation effects

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dc.contributor.authorKim, KHko
dc.contributor.authorJeon, SCko
dc.contributor.authorKim, YSko
dc.contributor.authorCho, Gyuseongko
dc.date.accessioned2009-07-23T06:09:21Z-
dc.date.available2009-07-23T06:09:21Z-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.issued2005-01-
dc.identifier.citationNUCLEAR INSTRUMENTS METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, v.537, no.1-2, pp.454 - 457-
dc.identifier.issn0168-9002-
dc.identifier.urihttp://hdl.handle.net/10203/10235-
dc.description.abstractTo see the effects of the direct X-ray in a Lanex screen-coupled CMOS APS imager, we measured modulation transfer function (MTF), noise power spectrum (NPS), and detective quantum efficiency (DQE). These measurements were performed under the condition of non-destructive test (NDT). By increasing the cumulative exposure on the imager, the MTF was degraded, and also leading to the DQE degradation. Each parameter changed by the exposure is described in detail. (C) 2004 Elsevier B.V. All rights reserved.-
dc.languageEnglish-
dc.language.isoen_USen
dc.publisherELSEVIER SCIENCE BV-
dc.titleIndustrial X-ray imaging based on scintillators and CMOS APS array: direct X-ray irradiation effects-
dc.typeArticle-
dc.identifier.wosid000226737200098-
dc.identifier.scopusid2-s2.0-11344257299-
dc.type.rimsART-
dc.citation.volume537-
dc.citation.issue1-2-
dc.citation.beginningpage454-
dc.citation.endingpage457-
dc.citation.publicationnameNUCLEAR INSTRUMENTS METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT-
dc.embargo.liftdate9999-12-31-
dc.embargo.terms9999-12-31-
dc.contributor.localauthorCho, Gyuseong-
dc.contributor.nonIdAuthorKim, KH-
dc.contributor.nonIdAuthorJeon, SC-
dc.contributor.nonIdAuthorKim, YS-
dc.type.journalArticleArticle; Proceedings Paper-
dc.subject.keywordAuthordirect X-ray-
dc.subject.keywordAuthorCMOS APS-
dc.subject.keywordAuthorMTF-
dc.subject.keywordAuthorDQE-
dc.subject.keywordAuthorNDT-
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