Industrial X-ray imaging based on scintillators and CMOS APS array: direct X-ray irradiation effects
To see the effects of the direct X-ray in a Lanex screen-coupled CMOS APS imager, we measured modulation transfer function (MTF), noise power spectrum (NPS), and detective quantum efficiency (DQE). These measurements were performed under the condition of non-destructive test (NDT). By increasing the cumulative exposure on the imager, the MTF was degraded, and also leading to the DQE degradation. Each parameter changed by the exposure is described in detail. (C) 2004 Elsevier B.V. All rights reserved.
- Publisher
- ELSEVIER SCIENCE BV
- Issue Date
- 2005-01
- Language
- English
- Article Type
- Article; Proceedings Paper
- Citation
NUCLEAR INSTRUMENTS METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, v.537, no.1-2, pp.454 - 457
- ISSN
- 0168-9002
- Appears in Collection
- NE-Journal Papers(저널논문)
- Files in This Item
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