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Showing results 71601 to 71620 of 101401
| Scaling behaviour of the electro-optic hysteresis loops in a surface-stabilized ferroelectric liquid crystal You, JG; Yu, JS; Jin, MY; Kim, Jong Jean, JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.35, pp.S1478 - S1481, 1999-12 |
| Scaling exponents and transition behavior of the generalized conserved lattice gas model at zero temperature Yang, Jae Suk; Kim, In Mook; Kwak, Woo Seop, PHYSICAL REVIEW E, v.78, no.5, 2008-11 |
| Scaling exponents in foreign exchange markets Kim, CH; Kim, Soo Yong; Chang, KH; Kim, K, JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.51, pp.245 - 248, 2007-07 |
| Scaling Internet routers using optics Keslassy, I; Chuang, ST; Yu, K; Miller, D; Horowitz, M; Solgaard, O; McKeown, N, COMPUTER COMMUNICATION REVIEW, v.33, no.4, pp.189 - 200, 2003-10 |
| SCALING LAWS AND ASYMPTOTIC STATES FOR ION-ACOUSTIC TURBULENCE HORTON, W; Choi, Duk In; KOCH, RA, PHYSICS OF FLUIDS, v.22, no.4, pp.797 - 798, 1979 |
| Scaling laws between population and facility densities Um, Jaegon; Son, Seung-Woo; Lee, Sung-Ik; Jeong, Hawoong; Kim, Beom Jun, PROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA, v.106, no.34, pp.14236 - 14240, 2009-08 |
| Scaling laws for jet pulsations associated with high-resolution electrohydrodynamic printing Choi, Hong Kyoon; Park, Jang-Ung; Park, OOk; Ferreira, Placid M.; Georgiadis, John G.; Rogers, John A., APPLIED PHYSICS LETTERS, v.92, no.12, 2008-03 |
| Scaling Laws of Energy Efficiency Related Metrics for Varying Cell Radii in Downlink Cellular Systems Leem, Han-Sung; Jin, Hu; Sung, Dan-Keun, IEEE COMMUNICATIONS LETTERS, v.17, no.3, pp.525 - 528, 2013-03 |
| Scaling of Al2O3 dielectric for graphene field-effect transistors Fallahazad, B.; Lee, K.; Lian, G.; Kim, S.; Corbet, C. M.; Ferrer, D. A.; Colombo, L.; et al, APPLIED PHYSICS LETTERS, v.100, no.9, 2012-02 |
| Scaling of catalyst bed for hydrogen peroxide monopropellant thrusters using catalytic decomposition modeling Jung, Sangwoo; Choi, Sukmin; Heo, Seonuk; Kwon, Sejin, ACTA ASTRONAUTICA, v.187, pp.167 - 180, 2021-10 |
| Scaling of F-actin network rheology to probe single filament elasticity and dynamics Gardel, ML; Shin, Jennifer Hyunjong; MacKintosh, FC; Mahadevan, L; Matsudaira, PA; Weitz, DA, PHYSICAL REVIEW LETTERS, v.93, no.18, 2004-10 |
| Scaling of rough-wall turbulence by the roughness height and steepness Ma, Guo-Zhen; Xu, Chun-Xiao; Sung, Hyung Jin; Huang, Wei-Xi, JOURNAL OF FLUID MECHANICS, v.900, 2020-10 |
| Scaling of rough-wall turbulence in a transitionally rough regime Ma, Guo-Zhen; Xu, Chun-Xiao; Sung, Hyung Jin; Huang, Wei-Xi, PHYSICS OF FLUIDS, v.34, no.3, 2022-03 |
| Scaling Parameters for Critical Flow Rates of Subcooled Water Chun, Moon Hyun; Choon-Kyung Park; Moon-Ki Chung, TRANSACTIONS OF THE AMERICAN NUCLEAR SOCIETY, v.76, pp.293 - 295, 1997 |
| Scaling properties in time-varying networks with memory Kim, Hye Won; Ha, Meesoon; Jeong, Hawoong, EUROPEAN PHYSICAL JOURNAL B, v.88, no.12, pp.315, 2015-12 |
| Scaling simulation-to-real transfer by learning a latent space of robot skills Julian, Ryan C.; Heiden, Eric; He, Zhanpeng; Zhang, Hejia; Schaal, Stefan; Lim, Joseph J.; Sukhatme, Gaurav S.; et al, INTERNATIONAL JOURNAL OF ROBOTICS RESEARCH, v.39, no.10-11, pp.1259 - 1278, 2020-09 |
| SCALING STUDY OF IN-CORE BOIL-OFF AND HEATING PROCESS No, Hee Cheon; ISHII, M, NUCLEAR ENGINEERING AND DESIGN, v.143, no.2-3, pp.265 - 283, 1993-09 |
| SCALING THE SI METAL-OXIDE-SEMICONDUCTOR FIELD-EFFECT TRANSISTOR INTO THE 0.1-MU-M REGIME USING VERTICAL DOPING ENGINEERING YAN, RH; OURMAZD, A; LEE, KF; Jeon, DukYoung; PINTO, MR, APPLIED PHYSICS LETTERS, v.59, no.25, pp.3315 - 3317, 1991-12 |
| Scaling the water cluster size of Nafion membranes for a high performance Zn/Br redox flow battery Kim, Riyul; Yuk, Seongmin; Lee, Juhyuk; Choi, Chanyong; Kim, Soohyun; Heo, Jiyun; Kim, Hee-Tak, JOURNAL OF MEMBRANE SCIENCE, v.564, pp.852 - 858, 2018-10 |
| Scaling-CIM: eDRAM In-Memory-Computing Accelerator With Dynamic-Scaling ADC and Adaptive Analog Operation Kim, Sangjin; Um, Soyeon; Jo, Wooyoung; Lee, Jingu; Ha, Sangwoo; Li, Zhiyong; Yoo, Hoi-Jun, IEEE JOURNAL OF SOLID-STATE CIRCUITS, v.59, no.8, pp.2694 - 2705, 2024-08 |
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