Browse by Type Conference

Showing results 71121 to 71140 of 109372

71121
Reductive dechlorination of tetrachloroethylene by nano-sized mackinawite with cobalamin at high alkaline condition

김상우; 이우진, 2014 Summer Symposium of Environmental and Energy Division in KCS, KCS, 2014-08

71122
Reductive dechlorination of trichloroethylene(TCE) by carboxymethyl cellulose(CMC) stabilized Fe-Ni(CMC-Fe-Ni) nanoparticles,

Park, Joo Seong; Kyeong, Dae Seung; Arun Kumar, M; Lee, Woojin, 2016 Winter Symposium of Environmental and Energy Division in KCS(Yuyeon Conference), KCS, 2016-02-17

71123
Reductive degradation of RDX by bio-reduced iron bearing soil minerals

조창현; 배성준; 이우진, KOSSGE 2012 Spring Conference, 2012-04

71124
Reductive degradation of tetrachloroethylene by chemogenic and biogenic green rust

Lee. N; Bae. S; Lee, Woojin, The 246th ACS National Meeting & Exposition, The 246th ACS National Meeting & Exposition, 2013-09-08

71125
Reductive destruction of CFC by sodium naphthalenide

Han, SP; Yang, Seung-Man, 한국화학공학회 추계학술발표회, 한국화학공학회, 1992-10

71126
Reductive sorption of hexavalent chromium (Cr(VI)) by vivianite under various groundwater conditions

하선진; 이우진; 현성필, 2016 KOSSGE Spring Meeting and International Symposium, KOSSGE, 2016-04-14

71127
Redundancy resolution of robot manipulators using optimal control kinematic control

Kim, Sung-Woo; Park, Kang-Bark; Lee, Ju-Jang, Proceedings of the 1994 IEEE International Conference on Robotics and Automation, pp.683 - 688, IEEE, 1994-05-08

71128
Redundant Arm Kinematic Control with Recurrent Loop

Kil, Rhee Man, IEEE Conference on Decision and Control, 1993

71129
Redundant via insertion for multiple-patterning directed-self-assembly lithography

Shim, Seongbo; Chung, Woohyun; Shin, Youngsoo, 53rd Design Automation Conference (DAC), pp.41:1 - 41:6, ACM Special Interest Group on Design Automation (SIGDA), 2016-06-06

71130
Redundant via insertion in directed self-assembly lithography

Shim, Seong Bo; Chung, Woo Hyun; Shin, Young Soo, Design, Automation & Test in Europe (DATE), pp.55 - 60, European Design and Automation Association (EDAA), 2016-03-15

71131
Redundant via insertion in SADP process with cut merging and optimization

SONG, YOUNGSOO; Jung, Jinwook; Shin, Youngsoo, International Conference on Very Large Scale Integration (VLSI-SoC), IFIP, IEEE, 2017-10-24

71132
Redundant via insertion in self-aligned double patterning

Song, Youngsoo; Jung, Jinwook; Shin, Youngsoo, Conference on Design-Process-Technology Co-Optimization for Manufacturability XI, SPIE, 2017-03

71133
Redundant via insertion with cut optimization for self-aligned double patterning

Song, Youngsoo; Jung, Jinwook; Shin, Youngsoo, 27th Great Lakes Symposium on VLSI, GLSVLSI 2017, pp.137 - 142, Association for Computing Machinery, 2017-05-11

71134
Reengineering English language education at Korea's elite engineering school

Kim, EunGyong; Kim, Young-hee; Cho, Ai-Lee; Choe, Sook-Hee, The 45th Annual TESOL (Teachers of English to Speakers of Other Languages) Convention and Exhibit, pp.83, TESOL, 2011-03-17

71135
Reengineering English Language Education at Korea's Elite Engineering School

Kim, Eun-Kyeong; Kim, Young-hee; Choe, Sook-hee; Cho, Ailee, TESOL Conference, pp.1 - 50, 2011-03

71136
Reentrant Fiber Raman Gyroscope

Desurvire, E; Kim, Byoung Yoon; Fesler, K; Shaw, H, CLEO'86 Conference on Laser and Electro-Optics, pp.0 - 0, CLEO, 1986-06-00

71137
Reentrant flow shop scheduling using reinforcement learning

Kim, Duyeon; Kim, Hyunjung, IEEE International Conference on Automation Science and Engineering, IEEE Robotics and Automation Society, 2020-08-21

71138
Reentry prediction simulation of Tiangong-1 using STK and DRAMA

Kim, Siwoo; Ahn, Jaemyung; Choi, Eunjung; Cho, Sungki, The International Conference of Women Scientists and Engineers conference on BT, IT, ET and NT(BIEN), The Association of Korean Woman Scientists and Engineers, 2017-09-01

71139
Reentry-phase Tracking of a Ballistic Missile in the Presence of Radar Glint Noise

Zewge, Natnael S.; Bang, Hyochoong, 22nd International Conference on Control, Automation and Systems, ICCAS 2022, pp.452 - 457, IEEE Computer Society, 2022-11

71140
Reestimation and Best-First Parsing Algorithm for Probabilistic Dependency Grammars

Lee, Seungmi; Choi, Key-Sun, the 5th Workshop on Very Large Corpora (WVLC-5), pp.41 - 55, 1997

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