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Showing results 32061 to 32080 of 101366

32061
Electron scattering mechanisms in indium-tin-oxide thin films: grain boundary and ionized impurity scattering

Lee, HC; Park, OOk, VACUUM, v.75, no.3, pp.275 - 282, 2004-07

32062
Electron spin relaxations of phosphorus donors in bulk silicon under large electric field

Park, Daniel K.; Park, Sejun; Jee, Hyejung; Lee, Soonchil, SCIENTIFIC REPORTS, v.9, pp.2951, 2019-02

32063
Electron temperature analysis of two-gas-species inductively coupled plasma

Bai, KH; Chang, Hong-Young; Uhm, HS, APPLIED PHYSICS LETTERS, v.79, no.11, pp.1596 - 1598, 2001-09

32064
Electron temperature and pressure dependences of nonlinear phenomena in dust particle oscillation in dc plasmas

Seon, C. R.; Park, S.; Choe, Won-Ho; Seo, C. H.; Park, H. Y.; Chai, Kil-Byoung; Shin, Y. H., NEW JOURNAL OF PHYSICS, v.10, 2008-01

32065
Electron Temperature Anisotropy Driven by Electron Cyclotron Resonance Heating

Chang, Choong-Seock, PHENOMENA IN IONIZED GASES, v.4, no.0, pp.802 - 803, 1987-01

32066
Electron temperature control with a small mesh number grid in inductively coupled plasmas

Bai, KH; Choi, CK; Chang, Hong-Young, PLASMA SOURCES SCIENCE & TECHNOLOGY, v.13, pp.662 - 667, 2004-11

32067
Electron temperature control with grid bias in inductively coupled argon plasma

Hong, JI; Seo, SH; Kim, SS; Yoon, NS; Chang, Choong-Seock; Chang, Hong-Young, PHYSICS OF PLASMAS, v.6, no.3, pp.1017 - 1028, 1999-03

32068
Electron temperature fluctuations associated with the weakly coherent mode in the edge of I-mode plasmas

White, A. E.; Phillips, P.; Whyte, D. G.; Hubbard, A. E.; Sung, Choongki; Hughes, J. W.; Dominguez, A.; et al, NUCLEAR FUSION, v.51, no.11, 2011-11

32069
Electron Temperature Measurements Using a Two-Filter Soft X-ray Array in VEST

Lee, Myungwon; Lim, S; Jeong, W; Kim, S; Kim, JH; Hwang, YS; Sung, Choongki, SENSORS, v.23, no.20, 2023-10

32070
Electron Transport in a Multiple Quantum Dot: Recent Progress

Chung, Yunchul; Choi, Juho; Sim, Heung-Sun, JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.72, no.12, pp.1454 - 1466, 2018-06

32071
Electron transport in high quality undoped ZnO film grown by plasma-assisted molecular beam epitaxy

Jung, Yeon Sik; Kononenko, OV; Choi, WK, SOLID STATE COMMUNICATIONS, v.137, no.9, pp.474 - 477, 2006-03

32072
Electron transport in quantum wires with a magnetic quantum dot

Sim, Heung-Sun; Chang, Kee-Joo; Kim, N; Ihm, G, JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.39, no.3, pp.519 - 521, 2001-09

32073
Electron transport in telescoping carbon nanotubes

Kim, DH; Chang, Kee-Joo, PHYSICAL REVIEW B, v.66, no.15, pp.155402 - 155402, 2002-10

32074
Electron transport in the downstream region of planar unbalanced magnetron discharge

Seo, SH; Chang, Hong-Young, JOURNAL OF APPLIED PHYSICS, v.96, pp.1310 - 1317, 2004-08

32075
Electron Transport Layers Based on Oligo(ethylene glycol)-Incorporated Polymers Enabling Reproducible Fabrication of High-Performance Organic Solar Cells

Lee, Seungjin; Kim, Youngwoong; Kim, Donguk; Jeong, Dahyun; Kim, Geon-U; Kim, Jinseck; Kim, Bumjoon J., MACROMOLECULES, v.54, no.15, pp.7102 - 7112, 2021-08

32076
Electron transport properties in magnetic tunnel junctions with epitaxial NiFe (111) ferromagnetic bottom electrodes

Yu, JH; Lee, HyuckMo; Ando, Y; Miyazaki, T, APPLIED PHYSICS LETTERS, v.82, no.26, pp.4735 - 4737, 2003-06

32077
Electron transport through quantum-dot states of n-type carbon nanotubes

Kim, Yong-Hyun; Chang, Kee-Joo, APPLIED PHYSICS LETTERS, v.81, no.12, pp.2264 - 2266, 2002-09

32078
ELECTRON YIELD XAFS STUDY OF EVAPORATED CO/PD MULTILAYERS WITH VARIOUS THICKNESS RATIOS OF CO TO PD SUBLAYERS - SIMULATIONS OF THE CO K-EDGE XAFS AND FOURIER-TRANSFORMS

CHOI, M; JOO, JH; Kim, Sang-Koog; KANG, JS; LEE, YP; Shin, Sung-Chul; HEALD, SM, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES REVIEW PAPERS, v.32, pp.410 - 412, 1993

32079
ELECTRON-BEAM EXPOSURE (EBE) AND EPITAXY OF GAAS FILMS ON CAF2/SI STRUCTURES

Lee, Hee Chul; ASANO, T; ISHIWARA, H; FURUKAWA, S, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES REVIEW PAPERS, v.27, no.9, pp.1616 - 1625, 1988-09

32080
Electron-beam irradiation-induced gate oxide degradation

Cho, Byung Jin; Chong, PF; Chor, EF; Joo, MS; Yeo, IS, JOURNAL OF APPLIED PHYSICS, v.88, no.11, pp.6731 - 6735, 2000-12

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