Showing results 32061 to 32080 of 101401
Electron microscopy of high pressure crystallised poly (p-phenylene sulfide) Lu, J; Oh, Il-Kwon; Huang, R; Cheng, TH; Wang, XL, PLASTICS RUBBER AND COMPOSITES, v.37, no.5-6, pp.263 - 267, 2008 |
Electron microscopy study of novel Pt nanowires synthesized in the spaces of silica mesoporous materials Terasaki, O; Liu, Z; Ohsuna, T; Shin, HJ; Ryoo, Ryong, MICROSCOPY AND MICROANALYSIS, v.8, no.1, pp.35 - 39, 2002-02 |
Electron Mobility Enhancement of Extremely Thin Body In0.7Ga0.3As-on-Insulator Metal-Oxide-Semiconductor Field-Effect Transistors on Si Substrates by Metal-Oxide-Semiconductor Interface Buffer Layers Kim, SangHyeon; Yokoyama, Masafumi; Taoka, Noriyuki; Iida, Ryo; Lee, Sunghoon; Nakane, Ryosho; Urabe, Yuji; et al, APPLIED PHYSICS EXPRESS, v.5, no.1, 2012-01 |
Electron mobility enhancement using ultrathin pure Ge on Si substrate Yeo, CC; Cho, Byung Jin; Gao, E; Lee, SJ; Lee, AH; Yu, CY; Liu, CW; et al, IEEE ELECTRON DEVICE LETTERS, v.26, no.10, pp.761 - 763, 2005-10 |
Electron Mobility in Surface- and Buried-Channel Flatband In0.53Ga0.47As MOSFETs With ALD Al2O3 Gate Dielectric Bentley, Steven J.; Holland, Martin; Li, Xu; Paterson, Gary W.; Zhou, HP; Ignatova, Olesya; Thoms, Stephen; et al, IEEE ELECTRON DEVICE LETTERS, v.32, no.4, pp.494 - 496, 2011-04 |
Electron pair tunneling resonance in a double-dot interferometry Park, Jinhong; Sim, Heung-Sun, PHYSICAL REVIEW B, v.82, no.23, pp.235318 - 235318-5, 2010-12 |
Electron scattering mechanisms in indium-tin-oxide thin films: grain boundary and ionized impurity scattering Lee, HC; Park, OOk, VACUUM, v.75, no.3, pp.275 - 282, 2004-07 |
Electron spin relaxations of phosphorus donors in bulk silicon under large electric field Park, Daniel K.; Park, Sejun; Jee, Hyejung; Lee, Soonchil, SCIENTIFIC REPORTS, v.9, pp.2951, 2019-02 |
Electron temperature analysis of two-gas-species inductively coupled plasma Bai, KH; Chang, Hong-Young; Uhm, HS, APPLIED PHYSICS LETTERS, v.79, no.11, pp.1596 - 1598, 2001-09 |
Electron temperature and pressure dependences of nonlinear phenomena in dust particle oscillation in dc plasmas Seon, C. R.; Park, S.; Choe, Won-Ho; Seo, C. H.; Park, H. Y.; Chai, Kil-Byoung; Shin, Y. H., NEW JOURNAL OF PHYSICS, v.10, 2008-01 |
Electron Temperature Anisotropy Driven by Electron Cyclotron Resonance Heating Chang, Choong-Seock, PHENOMENA IN IONIZED GASES, v.4, no.0, pp.802 - 803, 1987-01 |
Electron temperature control with a small mesh number grid in inductively coupled plasmas Bai, KH; Choi, CK; Chang, Hong-Young, PLASMA SOURCES SCIENCE & TECHNOLOGY, v.13, pp.662 - 667, 2004-11 |
Electron temperature control with grid bias in inductively coupled argon plasma Hong, JI; Seo, SH; Kim, SS; Yoon, NS; Chang, Choong-Seock; Chang, Hong-Young, PHYSICS OF PLASMAS, v.6, no.3, pp.1017 - 1028, 1999-03 |
Electron temperature fluctuations associated with the weakly coherent mode in the edge of I-mode plasmas White, A. E.; Phillips, P.; Whyte, D. G.; Hubbard, A. E.; Sung, Choongki; Hughes, J. W.; Dominguez, A.; et al, NUCLEAR FUSION, v.51, no.11, 2011-11 |
Electron Temperature Measurements Using a Two-Filter Soft X-ray Array in VEST Lee, Myungwon; Lim, S; Jeong, W; Kim, S; Kim, JH; Hwang, YS; Sung, Choongki, SENSORS, v.23, no.20, 2023-10 |
Electron Transport in a Multiple Quantum Dot: Recent Progress Chung, Yunchul; Choi, Juho; Sim, Heung-Sun, JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.72, no.12, pp.1454 - 1466, 2018-06 |
Electron transport in high quality undoped ZnO film grown by plasma-assisted molecular beam epitaxy Jung, Yeon Sik; Kononenko, OV; Choi, WK, SOLID STATE COMMUNICATIONS, v.137, no.9, pp.474 - 477, 2006-03 |
Electron transport in quantum wires with a magnetic quantum dot Sim, Heung-Sun; Chang, Kee-Joo; Kim, N; Ihm, G, JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.39, no.3, pp.519 - 521, 2001-09 |
Electron transport in telescoping carbon nanotubes Kim, DH; Chang, Kee-Joo, PHYSICAL REVIEW B, v.66, no.15, pp.155402 - 155402, 2002-10 |
Electron transport in the downstream region of planar unbalanced magnetron discharge Seo, SH; Chang, Hong-Young, JOURNAL OF APPLIED PHYSICS, v.96, pp.1310 - 1317, 2004-08 |
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