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Yoon, Min; Ahn, Junsun; Hwang, Jinyul; Sung, Hyung Jin, PHYSICS OF FLUIDS, v.28, no.8, 2016-08

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Pyun, Su Il; h.-p.kim, BRITISH CORROSION JOURNAL, v.19, no.4, pp.192 - 195, 1984

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h.-p.kim; s.-i.pyun, 대한금속·재료학회지, v.22, no.7, pp.621 - 631, 1984

y.-s.kim; Pyun, Su Il, BRITISH CORROSION JOURNAL, v.18, no.2, pp.71 - 75, 1983

h.-s.jung; s.-i.pyun; h.-p.kim, 한국부식학회지, v.13, no.1, pp.1 - 6, 1984

Park, Sangdon; Lee, Joohyung; Bae, Sohee; Hwang, Ganguk; Choi, Jun Kyun, IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS, v.63, no.7, pp.4255 - 4265, 2016-07

Kim, Sanghoon; Baek, Seung-heon Chris; Ishibashi, Mio; Yamada, Kihiro; Taniguchi, Takuya; Okuno, Takaya; Kotani, Yoshinori; et al, APPLIED PHYSICS EXPRESS, v.10, no.7, pp.073006, 2017-07

K.H. Cho; S.K. Han; Kim, Jae Kwan, PHYSICAL REVIEW D, v.29, no.1, pp.46 - 51, 1984

Ko, Pyungwon, PHYSICAL REVIEW D, v.47, no.9, pp.3933 - 3937, 1993-05

Min, Soohong; Oh, Yangkyun; Verma, Pushpa; Whitehead, Samuel C.; Yapici, Nilay; Van Vactor, David; Suh, Greg S. B.; et al, ELIFE, v.10, 2021-02

Suh, In-Soo; Shin, Eun-Gyeong, Journal of Integrated Design and Process Science, v.15, no.3, pp.29 - 42, 2011-09

Bai, KH; Chang, Hong-Young, APPLIED PHYSICS LETTERS, v.87, pp.299 - 308, 2005-09

Bai, KH; Lee, DS; Chang, Hong-Young; Uhm, HS, APPLIED PHYSICS LETTERS, v.80, no.21, pp.3907 - 3909, 2002-05

Kim, Se Kwon; Tewari, Sumanta; Tserkovnyak, Yaroslav, PHYSICAL REVIEW B, v.92, no.2, 2015-07

Wolkenhauer, O; Ghosh, BK; Cho, Kwang-Hyun, IEEE CONTROL SYSTEMS MAGAZINE, v.24, no.4, pp.30 - 34, 2004-08

Jee, E; Yoo, J; Cha, Sungdeok, COMPUTER SAFETY, RELIABILITY, AND SECURITY, PROCEEDINGS, v.3688, pp.67 - 80, 2005