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Showing results 174761 to 174780 of 226111

174761

X-ray absorption fine structure of Ru metal clusters supported on zeolite = 제올라이트에 담지된 Ru 금속 클러스터의 X선 흡광 연구link

Cho, Sung-June; 조성준; et al, 한국과학기술원, 1994

174762

X-ray absorption near-edge structure and optical properties of hafnium oxynitride thin films

Kim, Sung Kwan; Kim, Yang-soo; No, Kwangsooresearcher, ADVANCES IN QUANTUM CHEMISTRY, VOL 54: DV-X ALPHA FOR INDUSTRIAL-ACADEMIC COOPERATION Book Series: ADVANCES IN QUANTUM CHEMISTRY, v.54, pp.81 - 88, 2008

174763

X-RAY AND CHARGED-PARTICLE DETECTION WITH CSI(TL) LAYER COUPLED TO A-SI-H PHOTODIODE LAYERS

FUJIEDA, I; Cho, Gyuseongresearcher; DREWERY, J; GEE, T; JING, T; KAPLAN, SN; PEREZMENDEZ, V; et al, IEEE TRANSACTIONS ON NUCLEAR SCIENCE, v.38, no.2, pp.255 - 262, 1991-04

174764

X-ray and Delectric Studies of the Phase Transition in Pb*Yb1/2Nb1/2)O3-PbTiO3 Ceramics

h. lim; h.j. kim; Choo, Woong Kil, JAPANESE JOURNAL OF APPLIED PHYSICS - PART 1 : REGULAR PAPERS AND SHORT NOTES, v.34, pp.5449 - 5452, 1995

174765

X-ray and dielectric studies of Pb(Mg1/2W1/2)O-3 substituted Pb(Yb1/2Nb1/2)O-3 ceramics

Kim, JH; Koh, KS; Han, HS; Choo, Woong Kil, JOURNAL OF THE EUROPEAN CERAMIC SOCIETY, v.21, no.10-11, pp.1669 - 1672, 2001

174766

X-ray and dielectric studies of Sc-substituted Pb(Yb1/2Nb1/2)O-3 ceramics

jai-hyun kim; Choo, Woong Kil, FERROELECTRICS, v.270, pp.1255 - 1260, 2002

174767

X-ray and dielectric study of the phase transition in PbCo1/2W1/2O3-PbYb1/2Tao3 ceramics

Ho-Gi Kimresearcher, 한국요업학회, 1997-01-01

174768

X-ray and dielectric study of the phase transition in PbFe1/2Nb1/2O3-PbCo1/2W1/2O3 ceramics

Ho-Gi Kimresearcher, Korean Institute of Electric Engineers, 1997-01-01

174769

X-RAY AND DLTS CHARACTERIZATIONS OF INXGA1-X AS(X-LESS-THAN-0.03)/GAAS LAYERS GROWN BY VPE USING AN IN/GA ALLOY SOURCE

KIM, HS; KIM, EK; MIN, SK; Lee, Choochon, APPLIED PHYSICS A-MATERIALS SCIENCE PROCESSING, v.49, no.2, pp.143 - 147, 1989-08

174770

X-RAY AND ELECTRICAL STUDY OF THE PHASE-TRANSITIONS IN (PB(1-X)BA(X))(YB(1/2)NB(1/2))O3

KIM, HJ; PARK, KH; Choo, Woong Kil, FERROELECTRICS, v.127, no.1-4, pp.71 - 76, 1992

174771

X-ray CMOS 영상 센서의 대조 해상도 향상을 위해 Micro-inductor를 적용한 새로운 Sample-and-Hold 회로

이대희; 조규성researcher; 강동욱; 김명수; 조민식; 유현준; 김예원, 전자공학회논문지 - SD, v.49, no.4, pp.7 - 14, 2012-04

174772

X-Ray Computed Microtomography Imaging of Abiotic Carbonate Precipitation in Porous Media From a Supersaturated Solution: Insights Into Effect of CO2 Mineral Trapping on Permeability

Baek, Seunghun; Hong, Jung-Wukresearcher; Kim, Kwang Yeom; Yeom, Sun; Kwon, Tae-Hyukresearcher, WATER RESOURCES RESEARCH, v.55, no.5, pp.3835 - 3855, 2019-05

174773

X-ray computed tomography cone-beam analytic reconstruction using GPU = GPU를 이용한 x-선 전산화 단층 촬영의 Cone-beam 해석적 복원link

Lee, Yo-Han; 이요한; Youn, Chan-Hyunresearcher; 윤찬현; et al, 한국과학기술원, 2013

174774

X-ray Crystal Structure of Teicoplanin A2-2 Bound to a Catalytic Peptide Sequence via the Carrier Protein Strategy

Han, Sunkyuresearcher; Le, Binh, v.; Hajare, Holly S.; Baxter, Richard H. G.; Miller, Scott J., JOURNAL OF ORGANIC CHEMISTRY, v.79, no.18, pp.8550 - 8556, 2014-08

174775

X-ray Crystallography on Two Different systems: One for structure-Function and the Other for Drug Design

Oh, Byung-Haresearcher, 한국생물물리학회, 한국생물물리학회, 1995-07-14

174776

X-ray CT iterative reconstruction 과 compressed sensing 기법 개론

Ye, Jong-Chulresearcher, X-ray CT Recon Summer School at KAIST, 대한전자공학회 신호처리 소사이어티 바이오영상신호처리 연구회, 2014-08-26

174777

X-ray CT metal artifact reduction using L1 minimization = X-ray CT의 금속성 인공음영의 제거를 위한 L1 minimization 기법link

Choi, Ji-Young; 최지영; et al, 한국과학기술원, 2008

174778

X-ray diffraction analysis of mesostructured materials by continuous density function technique

Solovyov, LA; Belousov, OV; Shmakov, AN; Zaikovskii, VI; Joo, SH; Ryoo, Ryongresearcher; Haddad, E; et al, NANOTECHNOLOGY IN MESOSTRUCTURED MATERIALS, v.146, pp.299 - 302, 2003

174779

X-ray diffraction and dielectric properties of Fe3+ substituted Pb(Yb1/2Ta1/2)O-3

sang chul youn; kyung shin koh; Choo, Woong Kil, FERROELECTRICS, v.272, pp.2319 - 2324, 2002

174780

X-ray diffraction and Raman scattering studies in B-10(+)-implanted Cd0.96Zn0.04Te thin films prepared by vacuum evaporation

Sridharan, M; Narayandass, SK; Mangalaraj, D; Lee, Hee Chulresearcher, JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, v.14, pp.69 - 73, 2003-02

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