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Showing results 165981 to 166000 of 275408

165981
Reference SAW oscillator on quartz-on-silicon (QoS) wafer for polylithic integration of true single chip radio

Eo, Y; Hyun, S; Lee, Kwyro; Oh, G; Lee, JW, IEEE ELECTRON DEVICE LETTERS, v.21, no.8, pp.393 - 395, 2000-08

165982
Reference SAW oscillator on Quartz-on-Silicon (QoS) wafer for polylithic integration of true single chip radio

Eo, Yunseong; Hyun, Seokbong; Choi, Pilsoon; Lee, Kwyro; Oh, Gilhwan; Lee, Joong-Won, 1999 IEEE International Devices Meeting (IEDM), pp.761 - 764, IEEE, 1999-12-05

165983
Reference signal modification for fast convergence in LMS-based adaptive equalizers

Lee, G.H.; Choi, J.; Park, R.-H.; Song, Iickho; Song, G.W.; Park, J.H.; Lee, B.-U., pp.376 - 381, IEEE, 1994-11

165984
REFERENCE VOLTAGE GENERATING CIRCUIT

Cho, Gyu-Hyeong; Choi, Sungwon; Yuk, Youngsub

165985
'Reference' as standards : taming uncertainties and quality in the era of big data = '참조표준'을 통한 빅데이터 시대 불확실성 관리와 품질 재정의link

Lee, Do Young; Park, Buhm Soon; et al, 한국과학기술원, 2020

165986
Reference-Atlas-based 3-D reconstruction of the mouse brain from 2-D slice images

송준호; 송유향; 이승희; 백세범, 20th Korean Society for Brain and Neural Science Annual Meeting, The Korean Society for Brain and Neural Sciences, 2017-08-31

165987
Reference-based sketch image colorization using augmented-self reference and dense semantic correspondence

Lee, Junsoo; Kim, Eungyeup; Lee, Yunsung; Kim, Dongjun; Chang, Jaehyuk; Choo, Jaegul, IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2020, pp.5800 - 5809, IEEE Computer Society, 2020-06

165988
Reference-based sketch image colorization using augmented-self reference and dense semantic correspondence = 증강된 자신 참조와 촘촘한 의미 연결을 이용한 참조 기반 밑그림 채색 연구link

Lee, JunSoo; Choo, Jaegul; et al, 한국과학기술원, 2021

165989
Reference-free approaches for structural health monitoring

Sohn, Hoon, CIMTEC 2008: 3rd International Conference on Smart Materials, Structures and Systems, CIMTEC, 2008-06-08

165990
Reference-free Coating Thickness Quantification using Laser Thermography under Various Exterior Temperature Conditions

Hwang, Soonkyu; Park, Jiho; Jin, Z.; Sohn, Hoon, 14th Quantitative Infrared Thermography Conference (QIRT), pp.369 - 375, Fraunhofer-Institut für Zerstörungsfreie Prüfverfahren IZFP, 2018-06-26

165991
Reference-free crack detection under varying temperature

Sohn, Hoon, KSCE JOURNAL OF CIVIL ENGINEERING, v.15, no.8, pp.1395 - 1404, 2011-11

165992
Reference-free crack detection using transfer impedances

Park, Seunghee; Lee, Changgil; Sohn, Hoon, JOURNAL OF SOUND AND VIBRATION, v.329, no.12, pp.2337 - 2348, 2010-06

165993
Reference-free damage classification based on cluster analysis

Sohn, Hoon; Kim, SD; Harries, K, COMPUTER-AIDED CIVIL AND INFRASTRUCTURE ENGINEERING, v.23, no.5, pp.324 - 338, 2008-07

165994
Reference-free damage detection, localization and quantification in composite = 복합재료 손상의 무기저 진단 및 정량화link

Lim, Hyung-Jin; 임형진; et al, 한국과학기술원, 2011

165995
Reference-free damage detection, localization, and quantification in composites

Lim, Hyung Jin; Sohn, Hoon; Yeum, Chul Min; Kim, Ji Min, JOURNAL OF THE ACOUSTICAL SOCIETY OF AMERICA, v.133, no.6, pp.3838 - 3845, 2013-06

165996
Reference-free deflection measurement of general-shape bridges using data fusion

Cho, Soojin; Yun, Chung-Bang; Sim, Sung Han, Joint 6th International Conference on Advances in Experimental Structural Engineering, AESE 2015 and 11th International Workshop on Advanced Smart Materials and Smart Structures Technology, ANCRiSST 2015, EUCENTRE, 2015-08

165997
Reference-free delamination detection using Lamb waves

Yeum, Chul Min; Sohn, Hoon; Lim, Hyung Jin; Ihn, Jeong Beom, STRUCTURAL CONTROL & HEALTH MONITORING, v.21, pp.675 - 684, 2014-05

165998
Reference-free delamination detection, localization and quantification using a matching pursuit technique

Lim, Hyung Jin; Sohn, Hoon, Engineering Mechanics Institute Conference, ASCE, 2011-06-02

165999
Reference-free delamination quantification within multi-layer composite materials

Lim, Hyung Jin; Sohn, Hoon, KSNT Spring Conference, KSNT, 2011-05-26

166000
Reference-free EPI Nyquist ghost correction using annihilating filter-based low rank hankel matrix for K-space interpolation

Lee, Juyoung; Jin, Kyong Hwan; Ye, Jong Chul, IEEE International Symposium on Biomedical Imaging: From Nano to Macro, ISBI 2016, IEEE, 2016-04-16

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