Showing results 120321 to 120340 of 279446
Lateral migration of a microdroplet under optical forces in a uniform flow Cho, Hyunjun; Chang, Cheong-Bong; Jung, Jinho; Sung, Hyung-Jin, PHYSICS OF FLUIDS, v.26, no.12, 2014-12 |
Lateral migration of an elastic capsule by optical force in a uniform flow Chang, Cheong-Bong; Huang, Wei-Xi; Sung, Hyung-Jin, PHYSICAL REVIEW E, v.86, no.6, 2012-12 |
Lateral Misalignment Tolerance Enhancement by using Electromagnet Based Flux Gate in Wireless Power Transfer Systems Park, Jaehyoung; Hwang, Karam; Kim, Dongwook; Ahn, Seungyoung, IEEE Wireless Power Transfer Conference, IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, 2016-05-06 |
Lateral motion control of oectronic-four-wheel drive vehicles for enhancement of cornering performance Han, K.; Park, Giseo, Transactions of the Korean Society of Automotive Engineers, v.28, no.9, pp.605 - 611, 2020-08 |
Lateral overgrowth of germanium for monolithic integration of germanium-on-insulator on silicon Nam, Ju Hyung; Alkis, Sabri; Nam, Donguk; Afshinmanesh, Farzaneh; Shim, Jaewoo; Park, Jin-Hong; Brongersma, Mark; et al, JOURNAL OF CRYSTAL GROWTH, v.416, pp.21 - 27, 2015-04 |
Lateral Piezoelectricity of Alzheimer's Aβ Aggregates Jang, Jinhyeong; Joo, Soyun; Yeom, Jiwon; Jo, Yonghan; Zhang, Jingshu; Hong, Seungbum; Park, Chan Beum, ADVANCED SCIENCE, 2024-08 |
Lateral probing method and monolithically fabricated probes for minimization of damage on the solder of fine pitch micro-bumps = 미세 간격 마이크로-범프의 접합부 손상을 최소화하기 위한 측면 프로빙 방법과 단일 기판 공정 프로브의 제작link Kim, Chang Keun; Yoon, Jun Bo; et al, 한국과학기술원, 2017 |
Lateral profiling of gate dielectric damage by off-state stress and positive-bias temperature instability Lee, Geon-Beom; Kim, Choong-Ki; Bang, Tewook; Yoo, Min-Soo; Choi, Yang-Kyu, MICROELECTRONICS AND RELIABILITY, v.127, pp.114383, 2021-12 |
Lateral Quantum Dot Infrared Photodetector Hong, Songcheol; Oum, Joon Ho; LEE, Uk Hyun; Kang, Yong Hoon; Yang, Jong Ryul, international symposium on nanomanufacturing, 2004 |
Lateral redistribution of trapped charges in nitride/oxide/Si (NOS) investigated by electrostatic force microscopy Baik, Seung Jae; Lim, Koeng Su; Choi, Wonsup; Yoo, Hyunjun; Lee, Jang-Sik; Shin, Hyunjung, NANOSCALE, v.3, no.6, pp.2560 - 2565, 2011 |
Lateral resolution enhancement in confocal self-interference microscopy Kang D.; Gweon, Dae-Gab, Three- Dimensional and Multidomensional Microscopy: Image Acquisition and Processing XII, v.5701, pp.152 - 163, 2005-01-25 |
Lateral resolution enhancement in confocal self-interference microscopy with commercial calcite plate Kang, DK; Yoo, HK; Lee, SW; Gweon Dae Gab, 2nd International Symposium on Nano-manufacturing, 2004-11-03 |
Lateral Resolution Enhancement in Confocal Self-interference Microscopy with Commercial Calcite Plate Kang, DongKyun; Yoo, Hongki; Lee, Seungwoo; Gweon, Dae-Gab, Current Optics and Photonics, v.9, no.1, pp.32 - 35, 2005-03 |
Lateral Response of Large-Diameter Monopiles for Offshore Wind Turbines from Centrifuge Model Tests Choo, Yun Wook; Kim, Dongwook; Park, Jae-Hyun; Kwak, Kiseok; Kim, Jae-Hyun; Kim, Dong-Soo, GEOTECHNICAL TESTING JOURNAL, v.37, no.1, 2014-01 |
Lateral shift in photon tunneling studied by the energy streamline method Zhang, Z. M.; Lee, Bong Jae, OPTICS EXPRESS, v.14, no.21, pp.9963 - 9970, 2006-10 |
Lateral shifts in near-field thermal radiation with surface phonon polaritons Lee, Bong Jae; Zhang, Z. M., NANOSCALE AND MICROSCALE THERMOPHYSICAL ENGINEERING, v.12, no.3, pp.238 - 250, 2008 |
LATERAL SHIFTS OF TOTALLY REFLECTED GAUSSIAN BEAMS Shin, Sang Yung; FELSEN, LB, RADIO SCIENCE, v.12, no.4, pp.551 - 564, 1977 |
Lateral Silicon Field Emission Devices using Electron Beam Lithography Hyung-Cheol Shin, Micoroprocesses and Nanotechnology'99, pp.134 - 135, 1999 |
Lateral silicon field emission devices using electron beam lithography = 전자선 묘화를 이용한 측면형 실리콘 전계 방출 소자에 관한 연구link Yang, Sun-A; 양선아; et al, 한국과학기술원, 1999 |
Lateral Silicon Field-Emission Devices Using Electron Beam Lithography sangyeon han; sun-a yang; taekeun hwang; jongho lee; jong duk lee; hyungcheol shin, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1, v.39, no.5A, pp.2556 - 2559, 2000-05 |
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