| 29301 | Analysis of creep behavior of SiC/Al metal matrix composites based on a generalized shear-lag model Ryu, Ho Jin; Chung, KH; Cha, SI; Hong, Soon-Hyung, JOURNAL OF MATERIALS RESEARCH, v.19, no.12, pp.3633 - 3640, 2004-12 |
| 29302 | Analysis of Critical Race Combined Circuit with Timed Discrete Event Model Lee, MS; Cho, Kwang-Hyun; Lim, Jong-Tae, 4th International Conference On Mechatronic Technology, pp.538 - 540, 1999-10 |
| 29303 | Analysis of Cross-Ply Laminates with Transverse Cracks Based on the Assumed Crack Opening Deformation Hong, Chang Sun, Procd. of 2nd Int. Symposium on Composite Materials and Structures, pp.3 - 7, 1992 |
| 29304 | Analysis of CSMA/CA systems under carrier sensing error: Throughput, delay and sensitivity Jowoon Chong; Sung, Youngchul; Sung, Dan Keun, 2008 IEEE Global Telecommunications Conference, GLOBECOM 2008, pp.4934 - 4939, IEEE, 2008-11-30 |
| 29305 | Analysis of cultural values in online communication across countries on the use of nonverbal cues and content consumption = 온라인 커뮤니케이션에서의 문화비교 연구 : 비언어적 암시와 컨텐츠 소비패턴을 중심으로link Park, Jaram; 박자람; et al, 한국과학기술원, 2016 |
| 29306 | Analysis of current commercial japanese to korean machine translation systems and suggestions for future development Kim, TW; Choi, Key-Sun, JOURNAL OF NATURAL LANGUAGE PROCESSING, v.5, no.4, pp.127 - 149, 1998-01 |
| 29307 | Analysis of Current Transient from Pd and LaNi5 Electrodes in the Coexistence of Two Hydride Phases in Equilibrium 변수일, Korean Corros. Sci. Soc., pp.3 - 3, 1995 |
| 29308 | Analysis of Current Transient Obtained from Hydride Forming Electrode in the Coexistence of a- and b-Hydride Phases in Equilibrium 변수일, Korean Corros. Sci. Soc., pp.43 - 43, 1995 |
| 29309 | Analysis of customer behavior patterns for enhancing the collaborative recommendations : Ordinal scale-based implicit ratings approach = 협업 추천의 성능 향상을 위한 고객 행위 패턴 분석 : 서열 척도 기반의 암묵적 평가법link Lee, Seok-Kee; 이석기; et al, 한국과학기술원, 2009 |
| 29310 | Analysis of Customer Preferences for New Wireless Data Services Using AHP Ahn, Jae-Hyeon; Han, Sang-Pil; Kim, Moon-Koo; Jee, Kyoung-Yong, ITS Africa-Asia- Australia Regional conference, Perth Austria, pp.0 - 0, 2005-01-01 |
| 29311 | Analysis of Damage Curing in a MOSFET with Joule Heat Generated by Forward Junction Current at the Source and Drain Lee, Geon-Beom; Kim, Choong-Ki; Bang, Tewook; Yoo, Min-Soo; Park, Jun-Young; Choi, Yang-Kyu, MICROELECTRONICS RELIABILITY, v.104, 2020-01 |
| 29312 | Analysis of dangerous driving behavior from driving log data for traffic accident risk prediction = 교통사고 위험 예측을 위한 운행기록 데이터 위험 운전 행동 분석link Trirat, Patara; Lee, Jae-Gil; et al, 한국과학기술원, 2020 |
| 29313 | Analysis of dark current and 1/f noise in long-wavelength infrared $Hg_{1-x}Cd_xTe$ photodiodes = 장파장 적외선 감지를 위한 $Hg_{1-x}Cd_xTe$ 광다이오드의 암전류 및 1/f 잡음 분석link Bae, Soo-Ho; 배수호; et al, 한국과학기술원, 2002 |
| 29314 | Analysis of Data from Fanities of Identical Twins : Comparison of Virtlin-pair and Among Component Estimates of Genetic Variance j. c. christian; j. a. jr. norton; Kang, Kae Won, AMERICAN JOURNAL OF HUMAN GENETICS, v.29, 1977 |
| 29315 | Analysis of debris-flow events occurred in Korea in 2013 using improved Extreme Rainfall Index(ERI) Kang, Sin Hang; Lee, Seung Rae, The 26th KKHTCNN Symposium on Civil Engineering, KKHTCNN, 2013-11-19 |
| 29316 | Analysis of Decision-making Models for Mitigating Accidents in Extreme Conditions 강성근; 성풍현, 한국원자력학회 2019 춘계학술발표회, 한국원자력학회, 2019-05-24 |
| 29317 | ANALYSIS OF DEEP INELASTIC ELECTRON-NUCLEON AND MUON-NUCLEON SCATTERING IN BROKEN COLOR GAUGE-THEORY KIM, JK; Koh, In-Gyu; SHIN, HJ, NUCLEAR PHYSICS B, v.179, no.2, pp.357 - 364, 1981 |
| 29318 | Analysis of Deep Neural Network Performance Enhancement via Radiomic and Deep Feature Extraction Lee, Seoyoung; Kim, Hyeongseok; Cho, Seungryong, The 9th Korea-Japan Joint Meeting on Medical Physics( 한일의학물리학회), Korean Society of Medical Physics, 2021-09-09 |
| 29319 | Analysis of deep-drawing of circular and square cups considering planar anisotropy Chung, W.J.; Yang, Dong-Yol; Kim, Y.J., Proc. 3rd ICPT, v.3, pp.1135 - 1142, 1990 |
| 29320 | Analysis of Defective Patterns on Wafers in Semiconductor Manufacturing: A Bibliographical Review Yum, Bong-Jin; Koo, Jaehoon; Kim, Seong-Jun, 2012 IEEE International Conference on Automation Science and Engineering (CASE), pp.86 - 90, IEEE Robotics and Automation Society, 2012-08-21 |
