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ADI-FDTD method perturbed by the second order cross derivative terms Kong, KB; Kim, JS; Park, SeongOok, MICROWAVE AND OPTICAL TECHNOLOGY LETTERS, v.50, pp.1822 - 1826, 2008-07 |
Oversampling Expansion in Wavelet Subspaces Kwon, Kil Hyun; Lee, Dae Gwan, IEICE TRANSACTIONS ON FUNDAMENTALS OF ELECTRONICS COMMUNICATIONS AND COMPUTER SCIENCES, v.E94A, no.5, pp.1184 - 1193, 2011-05 |
Reduction of numerical dispersion by optimizing second-order cross product derivative term in the ADI-FDTD method Kong, KB; Kim, JS; Park, SeongOok, MICROWAVE AND OPTICAL TECHNOLOGY LETTERS, v.50, pp.123 - 127, 2008-01 |
Sampling expansion in shift invariant spaces Kim, J. M; Kwon, Kil Hyun, INTERNATIONAL JOURNAL OF WAVELETS MULTIRESOLUTION AND INFORMATION PROCESSING, v.6, no.2, pp.223 - 248, 2008-03 |
Truncation error evaluation method for minimal cut set-based fault tree analysis Choi, JS; Cho, Nam-Zin, JOURNAL OF NUCLEAR SCIENCE AND TECHNOLOGY, v.42, no.10, pp.854 - 860, 2005-10 |
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