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Power Blurring: Fast Static and Transient Thermal Analysis Method for Packaged Integrated Circuits and Power Devices Ziabari, Amirkoushyar; Park, Je-Hyoung; Ardestani, Ehsan K.; Renau, Jose; Kang, Sung-Mo; Shakouri, Ali, IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, v.22, no.11, pp.2366 - 2379, 2014-11 |
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