Browse by Subject multiple-level cell (MLC)

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Endurance reliability of multilevel-cell flash memory using a ZrO2/Si3N4 dual charge storage layer

Zhang, G; Hwang, WS; Lee, SH; Cho, Byung Jinresearcher; Yoo, WJ, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.55, no.9, pp.2361 - 2369, 2008-09

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