DSpace at KOASAS
Browsing DSpace

Browse by Subject junctionless

A to Z

All 0-9

A B C D E F G H I J K L M N O P Q R S T U V W X Y Z

or enter first few letters:

Showing results 1 to 6 of 6

1
A Comparative Study on Hot-Carrier Injection in 5-story Vertically Integrated Inversion-Mode and Junctionless-Mode Gate-All-Around MOSFETs

Kim, Seong-Yeon; Lee, Byung-Hyun; Hur, Jae; Park, Jun-Young; Jeon, Seung-Bae; Lee, Seung-Wook; Choi, Yang-Kyu, IEEE ELECTRON DEVICE LETTERS, v.39, no.1, pp.4 - 7, 2018-01

2
Electro-Thermal Erasing at 10(4)-Fold Faster Speeds in Charge-Trap Flash Memory

Kim, Myung-Su; Ahn, Dae-Chul; Park, Jun-Young; Seo, Myungsoo; Kim, Seong-Yeon; Kim, Wu-Kang; Yun, Dae-Hwan; et al, IEEE ELECTRON DEVICE LETTERS, v.40, no.2, pp.196 - 199, 2019-02

3
Engineering of source/drain junctions in MOSFETs and its application to memory cells = MOSFET의 소스/드레인 전극의 엔지니어링 및 메모리 셀로의 응용link

Choi, Sung-Jin; 최성진; et al, 한국과학기술원, 2012

4
In-depth study of reliability for charge-trap-type flash memory devices = 전하포획형 플래시 메모리 소자의 신뢰성에 관한 심층 연구link

Park, Jong-Kyung; 박종경; et al, 한국과학기술원, 2014

5
Nonvolatile Memory by All-Around-Gate Junctionless Transistor Composed of Silicon Nanowire on Bulk Substrate

Choi, Sung-Jin; Moon, Dong-Il; Kim, Sung-Ho; Ahn, Jae-Hyuk; Lee, Jin-Seong; Kim, Jee-Yeon; Choi, Yang-Kyu, IEEE ELECTRON DEVICE LETTERS, v.32, no.5, pp.602 - 604, 2011-05

6
Ultra-Fast Erase Method of SONOS Flash Memory by Instantaneous Thermal Excitation

Ahn, Dae-Chul; Seol, Myeong-Lok; Hur, Jae; Moon, Dong-Il; Lee, Byung-Hyun; Han, Jin-Woo; Park, Jun-Young; et al, IEEE ELECTRON DEVICE LETTERS, v.37, no.2, pp.190 - 192, 2016-02

Discover

rss_1.0 rss_2.0 atom_1.0